Advances in Imaging and Electron Physics 198
Peter W. Hawkes (Eds.)Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronicsand Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, and digital image processing
Catégories:
Année:
2016
Edition:
1
Editeur::
Academic Press
Langue:
english
Pages:
154
ISBN 10:
0128048107
ISBN 13:
9780128048108
Collection:
Advances in Imaging and Electron Physics 198
Fichier:
PDF, 11.23 MB
IPFS:
,
english, 2016